Nayak, N.U. and Sureshbapu, R.H. and Nalini, T. and Manojkumar, T.K. and Rameshbapu, G.N.K. and Ramakrishnan, K.R. (2004) PC based coulometric thickness gauge. Journal of the Instrumentation Society of India, 34 (1). pp. 32-37.
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Abstract
Coulometric technique of thickness measurement is based on Faraday’s first law of electrolysis. This method involves the measurement of quantity of electricity required to dissolve the coating anodically from a known area of the sample. Several factors affect the accuracy of the method. This paper describes the design and development of a PC based Coulometric thickness gauge. A software package has been developed to run the experiments automatically. The results obtained using the developed instrument have been presented.
| Item Type: | Article |
|---|---|
| Subjects: | Electrochemical Instrumentation |
| Divisions: | UNSPECIFIED |
| Depositing User: | ttbdu cecri |
| Date Deposited: | 29 Feb 2012 12:33 |
| Last Modified: | 29 Feb 2012 12:33 |
| URI: | http://cecri.csircentral.net/id/eprint/987 |
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