Murali, K.R. and Kumaresan, S. and Josephprince, J. (2007) Characteristics of CdS films brush electrodeposited on low-temperature substrates. Materials Science in Semiconductor Processing, 10. pp. 56-60.

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Abstract

Cadmium sulfide films were deposited by the brush plating technique on titanium and conducting glass substrates using a current density of 80mAcm�2. X-ray diffraction studies indicated the polycrystalline nature of the films. As the deposition temperature decreased, the peaks were broad indicating the formation of nanocrystallites. Optical absorption measurements yielded band gap values in the range of 2.60–3.00 eV as the deposition temperature decreases. XPS studies confirmed the formation of CdS. Atomic force microscope studies indicated the roughness of the films decreases with decrease of deposition temperature. The films have exhibited photoresponse without any pre-heat treatment.

Item Type:	Article
Uncontrolled Keywords:	CdS; II–VI; Thin films; Brush plating
Subjects:	Electrochemical Materials Science
Divisions:	UNSPECIFIED
Depositing User:	ttbdar CECRI
Date Deposited:	26 Mar 2012 10:31
Last Modified:	26 Mar 2012 10:31
URI:	http://cecri.csircentral.net/id/eprint/817

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