Murali, K.R. and Elango, P. and Gopalakrishnan, P. (2006) Structural and optical properties of CdSe films brush plated on low temperature substrates. Materials Chemistry and Physics, 96 (1). pp. 103-106. ISSN 0254-0584

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Abstract

CdSe thin films were brush plated on conducting glass and titanium substrates maintained at temperatures in the range 5–30 ◦C from the precursors. The films exhibited hexagonal structure. Optical band gap was found to vary in the range of 1.65–2.1 eV as the substrate temperature is decreased from 30 ◦C. XPS measurements indicated the formation of CdSe. Atomic force microscopy studies indicated fine grains of the order of 10 nm for the films deposited at 5 ◦C. Luminescence measurement indicated emission at 520 nm for an excitation of 570 nm.

Item Type:	Article
Uncontrolled Keywords:	CdSe; Thin films; Brush plating; Characterization
Subjects:	Electrochemical Materials Science
Divisions:	UNSPECIFIED
Depositing User:	ttbdu cecri
Date Deposited:	06 Apr 2012 15:12
Last Modified:	06 Apr 2012 15:12
URI:	http://cecri.csircentral.net/id/eprint/741

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