Murali, K.R. and Abirami, J. and Balasubramanian, T. (2008) Pulse plated zinc sulphide films and their characteristics. Journal of Materials Science: Materials Electron, 19 (3). pp. 217-222.

PDF Restricted to Registered users only Download (349Kb) | Request a copy

Abstract

Zinc sulphide thin films were deposited by the pulse plating technique using AR grade Zinc sulphate and sodium thiosulphate precursors. The pH of the deposition bath was adjusted to 2. The duty cycle was varied in the range of 20–60%. Total deposition time was kept constant as 60 min in all the cases. X-ray diffraction studies indicated the formation of single phase cubic zinc sulphide films. After heat treatment the crystal structure transformed to hexagonal structure. Optical absorption measurements indicated a band gap values in the range of 3.6–4.0 eV as the duty cycle decreased. EDAX studies yielded a composition of the films deposited at 50% duty cycle is Zn = 48%, S = 52%. XPS studies indicated the formation of ZnS. The Zn 2p and S 3p peaks are observed. AFM studies indicated a rms value of surface roughness of 55 nm for the films deposited at a duty cycle of 60%.

Item Type:	Article
Uncontrolled Keywords:	ZnS fims; II–VI; Pulse plating; Properties
Subjects:	Electrochemical Materials Science
Divisions:	UNSPECIFIED
Depositing User:	ttbdu cecri
Date Deposited:	31 Mar 2012 11:26
Last Modified:	31 Mar 2012 11:26
URI:	http://cecri.csircentral.net/id/eprint/346

Actions (login required)

View Item