Nayak, N.U. and Sureshbapu, R.H. and Nalini, T. and Shanbhogue, H.V. and Mahadevaiyer, Y. (1998) Microprocessor based eddy current thickness meter. Journal of Instrumentation Society of India, 28 (01). pp. 12-16.

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Abstract

A statistical eddy current thickness meter has been developed based on Intel 8085 microprocessor system. Two separate measuring probes have been designed to measure the thickness of coatings on non-magnetic and magnetic substrates. The performance of the instrument has been evaluated by using it to measure the thickness of different coatings on different substrates.

Item Type: Article
Uncontrolled Keywords: eddy current; thickness meter
Subjects: Electrochemical Instrumentation
Divisions: UNSPECIFIED
Depositing User: ttbdu cecri
Date Deposited: 04 May 2012 11:00
Last Modified: 04 May 2012 11:01
URI: http://cecri.csircentral.net/id/eprint/1377

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