Jebarajdevadasan, J. and Sanjeeviraja, C. and Jayachandran, M. (2001) Electrodeposition of p-WS2 thin film and characterisation. Journal of Crystal Growth, 226 (1). pp. 67-72. ISSN 0022-0248

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Abstract

Polycrystalline tungsten disulfide (WS2) thin films are electrodeposited on conducting glass plates in galvanostatic route. The deposited films are characterised structurally by taking X-ray diffraction, and the phase is confirmed as 2Hhexagonal and the preferential orientation is along (0 0 4) plane. The electrodeposited films are of type-II with the Van der Waals face parallel to the substrate. The lattice constants are calculated and reported. The band gap of the material is found from the absorption spectrum and the surface morphology is analysed by scanning electron microscope. The nature of the film is found as p-type from the negative slope of the Mott–Schottky plot and the semiconductor parameters like flatband potential and acceptor density are calculated. The photoelectrochemical solar cell behavior of p-WS2 film is studied and its output characteristics are presented.

Item Type:	Article
Uncontrolled Keywords:	Characterization; Electrodeposition; Polycrystalline deposition; WS2; Semiconducting materials; Solar cells
Subjects:	Electrochemical Materials Science
Divisions:	UNSPECIFIED
Depositing User:	ttbdu cecri
Date Deposited:	05 Apr 2012 12:12
Last Modified:	05 Apr 2012 12:12
URI:	http://cecri.csircentral.net/id/eprint/1117

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