Subramanian, B. and Sanjeeviraja, C. and Jayachandran, M. (2002) Brush plating of tin(II) selenide thin films. Journal of Crystal Growth, 234 (2). pp. 421-426. ISSN 0022-0248

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Abstract

Brush plating technique has been adopted for the first time to coat tin selenide thin film on tin oxide coated conducting substrates at room temperature, 501C and 601C. Uniform and pinhole free films were deposited at potentials 5.0 V. XRD analyses show the polycrystalline nature of the films with orthorhombic structure. Optical studies show the indirect nature with a bandgap of 1.0 eV. SEM pictures show smooth and uniform surface morphology with a grain size of about 0.3 mm. Film roughness was characterized by atomic force microscopy. Mott–Schottky plot has been drawn to evaluate the semiconductor parameters.

Item Type:	Article
Uncontrolled Keywords:	Characterization; Semiconducting materials; Solar cells
Subjects:	Electrochemical Materials Science
Divisions:	UNSPECIFIED
Depositing User:	ttbdu cecri
Date Deposited:	26 Mar 2012 10:27
Last Modified:	26 Mar 2012 10:27
URI:	http://cecri.csircentral.net/id/eprint/1066

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