Srinivasan, R. (1986) Computer programme for ellipsometric study of surface films. Bulletin of Electrochemistry , 2 (3). pp. 193-195. ISSN 0256-1654

PDF - Published Version
Download (120Kb) | Preview


Thickness and refractive index of non-light-absorbing surface films can be found out accurately from optical measurements by ellipsometry. However, the mathematical calculations are extremely tedious requiring the use of modern computers. The present paper describes a computer programme developed for this purpose.

Item Type: Article
Uncontrolled Keywords: Ellipsometry; Surface film thlckness; Computer Programme
Subjects: Electrochemical Instrumentation
Depositing User: ttbdar CECRI
Date Deposited: 23 Mar 2012 12:56
Last Modified: 23 Mar 2012 12:56

Actions (login required)

View Item View Item