Srinivasan, R. (1986) Computer programme for ellipsometric study of surface films. Bulletin of Electrochemistry , 2 (3). pp. 193-195. ISSN 0256-1654

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Abstract

Thickness and refractive index of non-light-absorbing surface films can be found out accurately from optical measurements by ellipsometry. However, the mathematical calculations are extremely tedious requiring the use of modern computers. The present paper describes a computer programme developed for this purpose.

Item Type:	Article
Uncontrolled Keywords:	Ellipsometry; Surface film thlckness; Computer Programme
Subjects:	Electrochemical Instrumentation
Divisions:	UNSPECIFIED
Depositing User:	ttbdar CECRI
Date Deposited:	23 Mar 2012 12:56
Last Modified:	23 Mar 2012 12:56
URI:	http://cecri.csircentral.net/id/eprint/2192

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