Murali, K.R. and Clara Dhanemozhi, A. and Rita, J. (2008) Brush plated ZnS films and their properties. Journal of Alloys and Compounds, 464 (1-2). pp. 383-386.

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Abstract

Zinc sulphide thin tilms were deposited by the brush plating technique using AR grade zinc sulphate and sodium thiosulphate on titanium and conductingglasssubstratesatacurrentdensity of80mAcm-2andatdifferentdepositiontemperatures intherange30-80' C. The films exhibited cubic SlnJclure. Band gap or the films were in the range of 3.79-3.93 eV Auger spectra or the ZnS films deposited at dilTerent current densitic indicated th~t the Zn/S ratio varies in the range of 1.02-1,04, Room temperature PL spectrum of the fi Ims deposited at 80 'C indicated two emission peaks at 420 and 480 om for an excitation of 325 nm. Resistivity of the film varied from 200-769 Q cm as the deposition temperature increased.

Item Type:	Article
Uncontrolled Keywords:	Thin films; Semiconductor; Chemical synthesis; X-ray diffraction; Luminescence
Subjects:	Industrial Metal Finishing Electrochemical Materials Science
Divisions:	UNSPECIFIED
Depositing User:	ttbdu cecri
Date Deposited:	17 Jan 2012 09:53
Last Modified:	17 Jan 2012 09:53
URI:	http://cecri.csircentral.net/id/eprint/212

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