Murali, K.R. (2007) Properties of sol–gel dip-coated zinc oxide thin films. Journal of Physics and Chemistry of Solids, 68. pp. 2293-2296.

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Zinc oxide (ZnO) films were deposited on glass substrates by the sol–gel dip coating method using acrylamide route. The films were characterized by X-ray diffraction studies which indicated wurtzite structure. Optical absorption measurements indicated band gap in the range 3.17–3.32 eV. XPS studies indicated the formation of ZnO. The resistivity of the films were in the range 1000–10,000 ohm cm.

Item Type: Article
Uncontrolled Keywords: A. Oxides; A. Semiconductors; A. Thin films; B. Sol–gel growth
Subjects: Electrochemical Materials Science
Depositing User: ttbdar CECRI
Date Deposited: 27 Mar 2012 15:38
Last Modified: 27 Mar 2012 15:38

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