Murali, K.R. and Kumaresan, S. and Josephprince, J. (2007) Properties of brush plated CdS films. Journal of Materials Science: Materials in Electronics, 18. pp. 487-493. ISSN 0957-4522

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Abstract

Cadmium sulphide (CdS) thin films were deposited for the first time using the brush plating technique from the precursors on titanium and conducting glass substrates. The films were polycrystalline possessing single-phase hexagonal structure. Surface morphological studies indicated increase of grain size with increase of post deposition temperature. Optical band gap of 2.39 eV was obtained. XPS studies indicated the formation of CdS. Photo electrochemical cell studies indicated higher current and voltages compared to earlier reports on thin film electrodes. Mott–Schottky studies exhibited n-type behaviour with a carrier density of 1018 cm–3. Spectral response measurements indicated a quantum efficiency of 0.35.

Item Type:	Article
Subjects:	Electrochemical Materials Science
Divisions:	UNSPECIFIED
Depositing User:	ttbdar CECRI
Date Deposited:	29 Mar 2012 07:54
Last Modified:	29 Mar 2012 07:54
URI:	http://cecri.csircentral.net/id/eprint/772

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