Moses Ezhil Raj, A. and Som, T. and Jayachandran, M. and Sanjeeviraja, C. (2010) Defect engineering and opto electronic property modifications by 1.5MeV Li+ implantation on nano crystalline MgIn2O4 thin films. Radiation Effects & Defects in Solids: Incorporating Plasma Science & Plasma Technology, 165 (4). pp. 265-276.

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Spinel MgIn2O4 thin films were deposited on quartz substrates by the chemical spray pyrolysis technique using metal organic precursors at 450◦C. Energetic 1.5MeV Li+ ions were implanted to various fluences of 1013, 1014 and 1015 ions/cm2 onto insulating MgIn2O4 films using a 9 SDH-2, NEC, 3MV accelerator to modify the material properties and surface nature. X-ray diffraction analysis was carried out to identify the changes in the crystallinity and grain orientations before and after implantations. Before implantation, the grains of polycrystalline MgIn2O4 were randomly oriented [(222), (311), (442) and (511)], and after implantation they exhibited a tendency to realign the crystallites along the even (hkl) planes [(222) and (442)]. On the Li+-implanted sample, one or more grains combine together and form bigger grains along with shallowpits, as observed through the atomic force micrographs. The as-deposited films have a percentage transmittance of 70–80% in the wavelength range 400–800 nm and the observed optical transmittance was less in Li+-implanted MgIn2O4 films. The index of refraction and the extinction co-efficient values were respectively n = 1.98 and k = 10−2 in the visible region. However, the DC electrical conductivity of Li+-implanted films to a fluence of 1015 ions/cm2 was nearly 0.7 S/cm at room temperature. The efficiency of the carrier generation was increased from 13.41% to 26.81% on annealing the implanted sample to lower fluence (1013 ions/cm2).

Item Type: Article
Uncontrolled Keywords: thin films; implantation; X-ray diffraction; optical property; electrical conductivity
Subjects: Electrochemical Materials Science
Depositing User: ttbdar CECRI
Date Deposited: 08 May 2012 06:18
Last Modified: 08 May 2012 06:18

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