Ahamed, M.G.S.B. and Nagarethinam, V.S. and Thayumanavan, A. and Murali, K.R. and Sanjeeviraja, C. and Jayachandran, M. (2010) Structural, optical, electrical and morphological properties of ZnTe films deposited by electron beam evaporation. Journal of Materials Science, 21. pp. 1229-1234. ISSN 0022-2461

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Abstract

ZnTe films were deposited on glass substrates at different substrate temperatures in the range 30–300 �C. The thickness of the films was about 200 nm. The films exhibited cubic structure with preferential orientation in the (111) direction. Band gap values in the range 2.34–2.26 eV are observed with increase of the substrate temperature. The refractive index values are in the range of 2.55–2.92 for the films deposited at different substrate temperatures. It is observed that the conductivity increases continuously with temperature. Laser Raman studies indicated the presence of peaks at 206.9 and 412.2 cm-1corresponding to the first order and second order LO phonon.

Item Type:	Article
Subjects:	Electrochemical Materials Science
Divisions:	UNSPECIFIED
Depositing User:	ttbdar CECRI
Date Deposited:	08 May 2012 07:11
Last Modified:	08 May 2012 07:11
URI:	http://cecri.csircentral.net/id/eprint/464

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