Murali, K.R. and Thirumoorthy, P. and Sengodan, V. (2009) Pulse plated cadmium telluride films and their characteristics. Ionics, 15 (2). pp. 209-213.

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Cadmium telluride thin films were deposited on conducting glass and titanium substrates by the pulse plating technique at different duty cycles in the range 10–50%. The films were characterised by X-ray diffraction and were found to possess single phase cubic structure. Optical studies indicated a direct band gap of 1.45 eV. Surface morphology of the films indicated that the crystallite size increases with increase of duty cycle. X-ray photoelectron spectroscopy studies confirmed the formation of CdTe. Electron-dispersive X-ray studies were made to estimate the composition. Crossplane resistivity measurements indicated that the resistivity decreases with increase of duty cycle.

Item Type: Article
Uncontrolled Keywords: CdTe; II–VI; Electrodeposition; Pulse plating
Subjects: Electrochemical Materials Science
Depositing User: TTBD CECRI
Date Deposited: 08 Apr 2012 14:49
Last Modified: 08 Apr 2012 14:49

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