Murali, K.R. (2008) Characteristics of sol–gel dip coated Ceria films. Journal of Materials Science: Materials in Electronics, 19 (4). pp. 369-371. ISSN 0957-4522
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Abstract
Cerium oxide(CeO2) thin films were deposited by the sol–gel dip coating technique using cerium chloride, acrylamide and N,N bis methylene acrylamide. The as deposited films were heat-treated at different temperatures in air. X-ray diffraction studies indicated the films to be of single phase CeO2. Optical bandgap in the range of 3.53– 3.60 eV was obtained from optical studies. Laser Raman studies exhibited Raman bands around 457 cm�1.
| Item Type: | Article |
|---|---|
| Subjects: | Electrochemical Materials Science |
| Divisions: | UNSPECIFIED |
| Depositing User: | ttbdu cecri |
| Date Deposited: | 20 Jan 2012 03:44 |
| Last Modified: | 20 Jan 2012 03:44 |
| URI: | http://cecri.csircentral.net/id/eprint/343 |
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