Ashok, K. and Subramanian, B. and Kuppusami, P. and Jayachandran, M. (2009) Effect of substrate temperature on structural and materials properties of zirconium nitride films on D9 steel substrates. Crystal Resistance Technology, 44 (5). pp. 511-516. ISSN 0232-1300

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Thin zirconium nitride (ZrN) films were prepared by using reactive direct current (DC) magnetron sputtering onto D9 steel substrates. XRD technique was employed to study the coatings, observing variations of crystallite size, crystallite texture and lattice constant, as a function of substrate temperature. Chemical states of the ZrN thin films were determined by X-ray photoelectron microscopy (XPS). AFM picture showed the presence of spherical shaped grains on the top of homogeneous granular surface. The hardness and elastic modulus values were measured by nanoindendation and their values are 18.5 and 343 GPa respectively.

Item Type: Article
Uncontrolled Keywords: thin films; magnetron sputtering; XRD; AFM
Subjects: Electrochemical Materials Science
Depositing User: TTBD CECRI
Date Deposited: 20 Jan 2012 22:54
Last Modified: 20 Jan 2012 22:54

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