Srinivasan, R. (1987) Computer program for the study of light absorbing surface films by ellipsometry. Bulletin of Electrochemistry , 3 (4). pp. 363-365. ISSN 0256-1654

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Abstract

A computer program for finding out the thickness, refractive index and extinction coefficient of opaque surface films from the experimental observation of angle parameters psi and delta has been formulated. This program with suitable modification can be applied to the optical constant determination of transparent films also.

Item Type:	Article
Uncontrolled Keywords:	Ellipsometry; film thickness; refractive index; extinction coefficient; computer program
Subjects:	Electrochemical Instrumentation
Divisions:	UNSPECIFIED
Depositing User:	ttbdar CECRI
Date Deposited:	23 Mar 2012 12:27
Last Modified:	23 Mar 2012 12:27
URI:	http://cecri.csircentral.net/id/eprint/2289

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