Divakara, S. and Madhu, S. and Somashekar, R. (2009) Stacking faults and microstructural parameters in non-mulberry silk fibres. Pramana - Journal of Physics, 73 (5). pp. 927-938. ISSN 0304-4289

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We have analysed the broadening of X-ray reflections observed in nonmulberry silk fibres in terms of stacking faults and microstructural parameters using a single-order method and have, with these parameters, developed, for the first time, a procedure to compute the whole pattern of these silk fibres. The essential deviations in the values of microstructural parameters obtained from line profile and whole pattern fitting procedures are discussed in this paper.

Item Type: Article
Uncontrolled Keywords: Stacking; Crystallite size; Fibres
Subjects: Electrochemical Instrumentation
Depositing User: ttbdu cecri
Date Deposited: 02 Apr 2012 06:24
Last Modified: 02 Apr 2012 06:24
URI: http://cecri.csircentral.net/id/eprint/1178

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